A Bayesian method for classification of images from electron micrographs

Abstract

Particle classification is an important component of multivariate statistical analysis methods that has been used extensively to extract information from electron micrographs of single particles. Here we describe a new Bayesian Gibbs sampling algorithm for the classification of such images. This algorithm, which is applied after dimension reduction by correspondence analysis or by principal components analysis, dynamically learns the parameters of the multivariate Gaussian distributions that characterize each class. These distributions describe tilted ellipsoidal clusters that adaptively adjust shape to capture differences in the variances of factors and the correlations of factors within classes. A novel Bayesian procedure to objectively select factors for inclusion in the classification models is a component of this procedure. A comparison of this algorithm with hierarchical ascendant classification of simulated data sets shows improved classification over a broad range of signal-to-noise ratios.