Inter-crystallite nanoretention of self-etching adhesives at enamel imaged by transmission electron microscopy

Abstract

The purpose of this in vitro study was to analyse the mode of action of self-etching adhesive systems when applied for resin-to-enamel bonding. Transmission electron microscopy was used to investigate the enamel-resin interface after application of non-rinsing self-etching adhesive systems based on phosphoric acid estered methacrylates (Clearfil Liner Bond 2, Clearfil SE Bond, Etch & Prime 3.0 and Resulcin AquaPrime) compared with conventional phosphoric acid etching and bonding (Heliobond). Non-decalcified ultrathin sections from the interface between enamel and self-etching adhesive systems revealed a 1.5-3.2-microm deep enamel surface layer characterized by a less-dense arrangement of enamel crystallites separated from each other by nanometer-sized spaces. A 1.5-3.2-microm wide, netlike resinous structure was observed in corresponding decalcified specimens, indicating that self-etching priming agents dissolve the peripheral and central part of the enamel crystallites, while simultaneously promoting inter- and intra-crystallite monomer infiltration. A similar pattern, but greater depth (6.9 microm) of enamel surface hybridization was found in the phosphoric acid-etched and bonded specimens. The nanoretentive interlocking between enamel crystallites and resin could explain the potential of self-etching adhesive systems in resin-to-enamel bonding despite the less distinct enamel etching pattern observed in scanning electron microscopy investigations.