ALLELIC MAPPING IN YEAST BY X-RAY-INDUCED MITOTIC REVERSION
- PMID: 14080327
- DOI: 10.1126/science.143.3606.581
ALLELIC MAPPING IN YEAST BY X-RAY-INDUCED MITOTIC REVERSION
Abstract
A new method for determining the sequence of mutational sites is based on the linear dose-effect relation for x-ray induction of allelic recombination in Saccharomyces cerevisiae. Mutations at two loci have been mapped by this method. The use of x-ray simplifies allelic mapping and greatly increases its sensitivity.
MeSH terms
LinkOut - more resources
Full Text Sources
Miscellaneous