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. 2007 Apr 6;98(14):145502.
doi: 10.1103/PhysRevLett.98.145502. Epub 2007 Apr 4.

Subnanometer-scale measurements of the interaction of ultrafast soft x-ray free-electron-laser pulses with matter

Stefan P Hau-Riege  1 , Henry N Chapman, Jacek Krzywinski, Ryszard Sobierajski, Sasa Bajt, Richard A London, Magnus Bergh, Carl Caleman, Robert Nietubyc, Libor Juha, Jaroslav Kuba, Eberhard Spiller, Sherry Baker, Richard Bionta, K Sokolowski Tinten, Nikola Stojanovic, Benjawan Kjornrattanawanich, Eric Gullikson, Elke Plönjes, Sven Toleikis, Thomas Tschentscher
Affiliations

Subnanometer-scale measurements of the interaction of ultrafast soft x-ray free-electron-laser pulses with matter

Stefan P Hau-Riege et al. Phys Rev Lett. .

Abstract

At the recently built FLASH x-ray free-electron laser, we studied the reflectivity of Si/C multilayers with fluxes up to 3 x 10(14) W/cm2. Even though the nanostructures were ultimately completely destroyed, we found that they maintained their integrity and reflectance characteristics during the 25-fs-long pulse, with no evidence for any structural changes over lengths greater than 3 A. This experiment demonstrates that with intense ultrafast pulses, structural damage does not occur during the pulse, giving credence to the concept of diffraction imaging of single macromolecules.

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