A dose-rate effect in single-particle electron microscopy
- PMID: 17977018
- PMCID: PMC2213720
- DOI: 10.1016/j.jsb.2007.09.017
A dose-rate effect in single-particle electron microscopy
Erratum in
- J Struct Biol. 2008 Nov;164(2):240
Abstract
A low beam intensity, low electron dose imaging method has been developed for single-particle electron cryo-microscopy (cryo-EM). Experiments indicate that the new technique can reduce beam-induced specimen movement and secondary radiolytic effects, such as "bubbling". The improvement in image quality, especially for multiple-exposure data collection, will help single-particle cryo-EM to reach higher resolution.
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