Development of a simplified simulation model for performance characterization of a pixellated CdZnTe multimodality imaging system

Abstract

Current requirements of molecular imaging lead to the complete integration of complementary modalities in a single hybrid imaging system to correlate function and structure. Among the various existing detector technologies, which can be implemented to integrate nuclear modalities (PET and/or single-photon emission computed tomography with x-rays (CT) and most probably with MR, pixellated wide bandgap room temperature semiconductor detectors, such as CdZnTe and/or CdTe, are promising candidates. This paper deals with the development of a simplified simulation model for pixellated semiconductor radiation detectors, as a first step towards the performance characterization of a multimodality imaging system based on CdZnTe. In particular, this work presents a simple computational model, based on a 1D approximate solution of the Schockley-Ramo theorem, and its integration into the Geant4 application for tomographic emission (GATE) platform in order to perform accurately and, therefore, improve the simulations of pixellated detectors in different configurations with a simultaneous cathode and anode pixel readout. The model presented here is successfully validated against an existing detailed finite element simulator, the multi-geometry simulation code, with respect to the charge induced at the anode, taking into consideration interpixel charge sharing and crosstalk, and to the detector charge induction efficiency. As a final point, the model provides estimated energy spectra and time resolution for (57)Co and (18)F sources obtained with the GATE code after the incorporation of the proposed model.