Si lattice parameter measurement by centimeter X-ray interferometry
- PMID: 18852795
- DOI: 10.1364/oe.16.016877
Si lattice parameter measurement by centimeter X-ray interferometry
Abstract
A combined X-ray and optical interferometer capable of centimeter displacements has been made to measure the lattice parameter of Si crystals to within a 3 x 10(-9) relative uncertainty. This paper relates the results of test measurements carried out to assess the capabilities of the apparatus.
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