Long-lived spin coherence in silicon with an electrical spin trap readout
- PMID: 19113380
- DOI: 10.1103/PhysRevLett.101.207602
Long-lived spin coherence in silicon with an electrical spin trap readout
Abstract
Pulsed electrically detected magnetic resonance of phosphorous (31P) in bulk crystalline silicon at very high magnetic fields (B0>8.5 T) and low temperatures (T=2.8 K) is presented. We find that the spin-dependent capture and reemission of highly polarized (>95%) conduction electrons by equally highly polarized 31P donor electrons introduces less decoherence than other mechanisms for spin-to-charge conversion. This allows the electrical detection of spin coherence times in excess of 100 mus, 50 times longer than the previous maximum for electrically detected spin readout experiments.
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