Doppler calibration method for Spectral Domain OCT spectrometers

Abstract

We present a calibration method for SD-OCT domain spectrometers based on the M-scan of a moving mirror. This method allows determination of the wavenumber sampling increment which determines the depth axis assigned to the structural image. It also allows wavelength calibration of individual pixels which ensures correct re-sampling prior to Fast Fourier Transform. Determination of the spectrometer resolution, which determines sensitivity and resolution decay with depth, is also possible. The wavelength calibration results suggest that hardware calibration of the spectrometers is a necessary complement to the computational methods presented here.