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. 2007 May 14;15(10):6036-43.
doi: 10.1364/oe.15.006036.

Characteristics of focused soft X-ray free-electron laser beam determined by ablation of organic molecular solids

J Chalupský  1 , L Juha, J Kuba, J Cihelka, V Hájková, S Koptyaev, J Krása, A Velyhan, M Bergh, C Caleman, J Hajdu, R M Bionta, H Chapman, S P Hau-Riege, R A London, M Jurek, J Krzywinski, R Nietubyc, J B Pelka, R Sobierajski, J Meyer-Ter-Vehn, A Tronnier, K Sokolowski-Tinten, N Stojanovic, K Tiedtke, S Toleikis, T Tschentscher, H Wabnitz, U Zastrau
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Free article

Characteristics of focused soft X-ray free-electron laser beam determined by ablation of organic molecular solids

J Chalupský et al. Opt Express. .
Free article

Abstract

A linear accelerator based source of coherent radiation, FLASH (Free-electron LASer in Hamburg) provides ultra-intense femtosecond radiation pulses at wavelengths from the extreme ultraviolet (XUV; lambda<100nm) to the soft X-ray (SXR; lambda<30nm) spectral regions. 25-fs pulses of 32-nm FLASH radiation were used to determine the ablation parameters of PMMA - poly (methyl methacrylate). Under these irradiation conditions the attenuation length and ablation threshold were found to be (56.9+/-7.5) nm and approximately 2 mJ*cm(-2), respectively. For a second wavelength of 21.7 nm, the PMMA ablation was utilized to image the transverse intensity distribution within the focused beam at mum resolution by a method developed here.

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