Atomic force microscope nanomanipulation with simultaneous visual guidance

Abstract

Atomic force microscopy (AFM) has been used to assemble prototype nanostructures consisting of colloidal nanoparticles. In the standard manipulation protocol, the AFM is used either as a manipulation tool or an imaging tool, but not both at the same time. We developed a new nanomanipulation protocol in which simultaneous visual guidance is obtained during manipulation. As an example, Au nanoparticles were manipulated on a substrate in two steps. First, a nanoparticle is kicked with the z feedback off. This kicking event reduces the static friction. Second, the nanoparticle is dribbled to a target position in tapping mode, and visual guidance is provided by a ghost trace of the nanoparticle. The new manipulation protocol greatly improves efficiency of manipulating small nanoparticles (15 nm in diameter or smaller). Our work highlights the importance and challenges of understanding friction at the nanoscale.