Precession electron diffraction using a digital sampling method

Abstract

A software-based method for collecting precession electron diffraction (PED) patterns is described. The PED patterns are obtained on a computer controlled transmission electron microscope. A series of electron diffraction (ED) patterns are collected as still ED frames at equal intervals, while the electron beam is precessed by one period (360°) around the optical axis. A PED pattern is obtained by combining the different ED frames, which resembles the sampling of a conventional PED pattern. Since intermediate ED frames are collected, it is possible to perform different post-processing strategies on the ED data. This can be used for geometric corrections to obtain accurate integrated intensities. The alignments and data collection are fully automated and controlled by software. The data quality is comparable to what can be achieved using specialized hardware for precession. The PED data can be used for structure solution and refinement with reasonably good R-values.