Dose perturbations at interfaces in photon beams: secondary electron transport
- PMID: 2110283
- DOI: 10.1118/1.596500
Dose perturbations at interfaces in photon beams: secondary electron transport
Abstract
An improved, quantitative version of the partial fluence model [Med. Phys. 14, 585 (1987)] for the calculation of dose perturbations at media interfaces in photon beams is presented and compared with measurements made at interfaces between polystyrene and materials ranging in atomic number from aluminum to lead, for photon beams ranging in energy from 60Co to 24 MV.
Publication types
MeSH terms
Grants and funding
LinkOut - more resources
Full Text Sources
