Angle-multiplexed waveguide resonance of high sensitivity and its application to nanosecond dynamics of molecular assemblies

Abstract

We report here the experimental demonstration of a high-performance optical waveguide resonance (WR) platform based on a judicious design of a dielectric/metal stack and a fabrication process that delivers an extraordinarily low-loss optical waveguide over a noble-metal thin film. By using an atomic layer deposition process to grow a dielectric film (Al(2)O(3)) of exceptional optical quality and precise thickness over a metal layer (Ag), we have reached a deep and narrow WR that allowed us to experimentally measure a performance of the WR device that is 20 times superior to the conventional surface plasmon resonance sensor. To the best of our knowledge, these results represent the best performance of a WR device reported so far in the literature. In addition, we have created an experimental setup based on diffraction-limited optical components to launch and collect a broad angular spectrum that is able to resolve the sharp angular waveguide resonance at a fast pace. Such configuration has enabled us to reach nanosecond time scale resolution, and we provide here experimental evidence of the fast coupling of the optical signal from a submonolayer of a ruthenium complex adsorbed to the interrogation surface. The high sensitivity and nanosecond detection capability of the WR optical platform demonstrated here are expected to find useful applications for researchers interested in studies of surface-mediated molecular interactions and interfacial phenomena.