Tip loading effects on AFM-based transport measurements of metal-oxide interfaces

Abstract

Here we demonstrate the effects of tip loading force on the contact quality and local current-voltage character between conductive AFM tips and individual noble metal nanoparticle-strontium titanate (NP-STO) interfaces. These results show that though contact quality may improve with increased loading force, nanoparticle deformation remains negligible for loading forces in the nN-μN range. Maintaining a moderate loading force in the tens to hundreds of nN therefore enables size-dependent transport of individual NP-STO interfaces to be determined.