Helium Ion Microscopy (HIM) for the imaging of biological samples at sub-nanometer resolution
- PMID: 24343236
- PMCID: PMC3865489
- DOI: 10.1038/srep03514
Helium Ion Microscopy (HIM) for the imaging of biological samples at sub-nanometer resolution
Abstract
Scanning Electron Microscopy (SEM) has long been the standard in imaging the sub-micrometer surface ultrastructure of both hard and soft materials. In the case of biological samples, it has provided great insights into their physical architecture. However, three of the fundamental challenges in the SEM imaging of soft materials are that of limited imaging resolution at high magnification, charging caused by the insulating properties of most biological samples and the loss of subtle surface features by heavy metal coating. These challenges have recently been overcome with the development of the Helium Ion Microscope (HIM), which boasts advances in charge reduction, minimized sample damage, high surface contrast without the need for metal coating, increased depth of field, and 5 angstrom imaging resolution. We demonstrate the advantages of HIM for imaging biological surfaces as well as compare and contrast the effects of sample preparation techniques and their consequences on sub-nanometer ultrastructure.
Conflict of interest statement
The author(s) declare that Chuong Huynh, David Ferranti, Lewis Stern and Bernhard Goetze are employed by the manufacturer of the commercial Orion PLUS Helium Ion Microscope (Carl Zeiss Microscopy, LLC). No other competing financial interests apply.
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