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. 2014 Apr;85(4):043705.
doi: 10.1063/1.4871437.

Combining low-energy electron microscopy and scanning probe microscopy techniques for surface science: development of a novel sample-holder

F Cheynis  1 , F Leroy  1 , A Ranguis  1 , B Detailleur  1 , P Bindzi  1 , C Veit  1 , W Bon  1 , P Müller  1
Affiliations

Combining low-energy electron microscopy and scanning probe microscopy techniques for surface science: development of a novel sample-holder

F Cheynis et al. Rev Sci Instrum. 2014 Apr.

Abstract

We introduce an experimental facility dedicated to surface science that combines Low-Energy Electron Microscopy/Photo-Electron Emission Microscopy (LEEM/PEEM) and variable-temperature Scanning Probe Microscopy techniques. A technical challenge has been to design a sample-holder that allows to exploit the complementary specifications of both microscopes and to preserve their optimal functionality. Experimental demonstration is reported by characterizing under ultrahigh vacuum with both techniques: Au(111) surface reconstruction and a two-layer thick graphene on 6H-SiC(0001). A set of macros to analyze LEEM/PEEM data extends the capabilities of the setup.

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