Cryogenic single-chip electron spin resonance detector
- PMID: 25261743
- DOI: 10.1016/j.jmr.2014.08.013
Cryogenic single-chip electron spin resonance detector
Abstract
We report on the design and characterization of a single-chip electron spin resonance detector, operating at a frequency of about 20 GHz and in a temperature range extending at least from 300 K down to 4 K. The detector consists of an LC oscillator formed by a 200 μm diameter single turn aluminum planar coil, a metal-oxide-metal capacitor, and two metal-oxide-semiconductor field effect transistors used as negative resistance network. At 300 K, the oscillator has a frequency noise of 20 Hz/Hz(1/2) at 100 kHz offset from the 20 GHz carrier. At 4 K, the frequency noise is about 1 Hz/Hz(1/2) at 10 kHz offset. The spin sensitivity measured with a sample of DPPH is 10(8)spins/Hz(1/2) at 300 K and down to 10(6)spins/Hz(1/2) at 4 K.
Keywords: CMOS; Cryogenic; ESR.
Copyright © 2014 Elsevier Inc. All rights reserved.
Publication types
LinkOut - more resources
Full Text Sources
Other Literature Sources
Miscellaneous
