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. 2016 Apr 14:5:72-4.
doi: 10.1016/j.ebcr.2016.04.002. eCollection 2016.

Mitigating bit flips or single event upsets in epilepsy neurostimulators

Alice X Dong  1 , Ryder P Gwinn  2 , Nicole M Warner  2 , Lisa M Caylor  2 , Michael J Doherty  2
Affiliations

Mitigating bit flips or single event upsets in epilepsy neurostimulators

Alice X Dong et al. Epilepsy Behav Case Rep. .

Abstract

Objectives: The objective of this study was to review software errors known as single event upsets (SEUs) or bit flips due to cosmic rays in epilepsy neurostimulators.

Materials and methods: A case report of a single event upset or bit flip is discussed; device manufacturers and publicly available data were queried for both incidence and types of error as well as strategies of software error mitigation.

Results: Neurostimulators, like other implanted devices such as pacemakers, are prone to single event upsets. Strategies for SEU mitigation are reviewed.

Conclusions: Cosmic radiation can threaten RAM and settings of neurostimulators; neuromodulation teams and device designers need to take this threat into account when designing multifunctional neuromodulation systems.

Keywords: Cosmic; Epilepsy; Neurostimulation; Neutron; Safety; Software.

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Figures

Fig. 1
Fig. 1
Coronal T2 MRI showing bilateral left > right hippocampal atrophy.
Fig. 2
Fig. 2
Lateral skull films showing RNS device and 4 contact depth electrodes over left and right hippocampi.
See this image and copyright information in PMC

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