Electron diffraction and diffraction contrast imaging of thin organic films

Abstract

The applications of electron diffraction and diffraction contrast electron microscopy with which to study the structure and dynamics of organic thin films are discussed. The techniques of making thin film deposits on substrates and of forming free-standing thin films over holes on the substrate are described. Selected area electron diffraction and diffraction contrast imaging techniques for thin film studies are elaborated, and examples are given. Methods to reduce radiation damage and environmental protection of the thin film specimen are outlined. The interpretation of electron diffraction and imaging data is given for three cases: 1) The effects of film tilting and molecular tilting (with respect to the film plane) are examined. 2) The detection of phase transition is illustrated. 3) The use of labels to mark film domains is shown together with the measurement of dynamic movement.