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. 1978;2(2):41-54.

Elemental microanalysis of enamel and dentin by secondary ion mass spectrometry (SIMS). Deciduous and permanent teeth from high and low fluoride area

  • PMID: 274829

Elemental microanalysis of enamel and dentin by secondary ion mass spectrometry (SIMS). Deciduous and permanent teeth from high and low fluoride area

L G Petersson et al. Swed Dent J. 1978.
No abstract available

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