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. 2009 Apr 1;114(2):99-135.
doi: 10.6028/jres.114.008. Print 2009 Mar-Apr.

Priorities for Standards and Measurements to Accelerate Innovations in Nano-Electrotechnologies: Analysis of the NIST-Energetics-IEC TC 113 Survey

Affiliations

Priorities for Standards and Measurements to Accelerate Innovations in Nano-Electrotechnologies: Analysis of the NIST-Energetics-IEC TC 113 Survey

Herbert S Bennett et al. J Res Natl Inst Stand Technol. .

Abstract

In 2008, the National Institute of Standards and Technology and Energetics Incorporated collaborated with the International Electrotechnical Commission Technical Committee 113 (IEC TC 113) on nano-electrotechnologies to survey members of the international nanotechnologies community about priorities for standards and measurements to accelerate innovations in nano-electrotechnologies. In this paper, we analyze the 459 survey responses from 45 countries as one means to begin building a consensus on a framework leading to nano-electrotechnologies standards development by standards organizations and national measurement institutes. The distributions of priority rankings from all 459 respondents are such that there are perceived distinctions with statistical confidence between the relative international priorities for the several items ranked in each of the following five Survey category types: 1) Nano-electrotechnology Properties, 2) Nano-electrotechnology Taxonomy: Products, 3) Nano-electrotechnology Taxonomy: Cross-Cutting Technologies, 4) IEC General Discipline Areas, and 5) Stages of the Linear Economic Model. The global consensus prioritizations for ranked items in the above five category types suggest that the IEC TC 113 should focus initially on standards and measurements for electronic and electrical properties of sensors and fabrication tools that support performance assessments of nano-technology enabled sub-assemblies used in energy, medical, and computer products.

Keywords: Borda count method; confidence interval; median method; nano-electrotechnologies; priorities; rankings; standards; statistical significance.

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Figures

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Demographics of Survey Respondents.
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Distribution of Survey Respondents: Nature of Work.
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Distribution of Survey Respondents: Place of Employment.
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Rank Distribution for Properties Category.
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Rank Distribution of Products.
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Rank Distribution of Cross-Cutting Technologies.
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Rank Distribution of General Discipline Areas.
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Rank Distribution of Stages of the Economic Model.
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Medians and Confidence Intervals for Property Rankings.
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Medians and Confidence Intervals for Product Rankings.
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Medians and Confidence Intervals for Cross-Cutting Technology Rankings.
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Medians and Confidence Intervals for General Discipline Rankings.
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Medians and Confidence Intervals for Economic Stage Rankings.
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Schematic of the correlation of the relative importance of Cross-Cutting Technology item EHS Applications and Effects with four of the eight Product items.
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Schematic of the correlation of the relative importance of Discipline Area item Health, Safety, and Environment with the Economic Model stages.
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Schematic of the correlation of the relative importance of Cross-Cutting Technology item EHS Applications and Effects with the Economic Model stages.
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Schematic of the correlation of the relative importance of Products item Medical Products with the Cross-Cutting Technologies category.
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Fig. 32
Schematic of the correlation of the relative importance of Cross-Cutting Technology item Sensors with the Products category.

References

    1. NNI What is Nanotechnology? 2009 Jan; http://www.nano.gov/html/facts/whatIsNano.html.
    1. IEC TC 113 Strategic Policy Statement. 2009 Jan; http://www.iec.ch/cgi-bin/getsps.pl/113.pdf?file=113.pdf.
    1. Semiconductor Industry Association . The International Technology Roadmap for Semiconductors. 2007 ed. SEMATECH; Austin, TX: Jan, 2009. Executive Summary. http://www.itrs.net/Links/2007ITRS/Home2007.htm.
    1. SEMI-SIA Report Publication Date. 2005 2009 Nov;Jan; http://www.semi.org/en/Press/P036750.
    1. RNCOS Group Research Report # RNC1125; Publication Date. 2007 2009 Feb;Jan; http://www.electronics.ca/reports/nanotechnology/world_market.html.

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