Skip to main page content
U.S. flag

An official website of the United States government

Dot gov

The .gov means it’s official.
Federal government websites often end in .gov or .mil. Before sharing sensitive information, make sure you’re on a federal government site.

Https

The site is secure.
The https:// ensures that you are connecting to the official website and that any information you provide is encrypted and transmitted securely.

Access keys NCBI Homepage MyNCBI Homepage Main Content Main Navigation
. 2016 Sep 12:6:33136.
doi: 10.1038/srep33136.

Dynamics of surface evolution in semiconductor thin films grown from a chemical bath

Affiliations

Dynamics of surface evolution in semiconductor thin films grown from a chemical bath

Indu Gupta et al. Sci Rep. .

Abstract

Dynamics of surface evolution in CdS thin films grown by chemical bath deposition technique has been studied from time sequence of atomic force micrographs. Detailed scaling analysis of surface fluctuation in real and Fourier space yielded characteristic exponents αloc = 0.78 ± 0.07, α = 2.20 ± 0.08, αs = 1.49 ± 0.22, β = 0.86 ± 0.05 and βloc = 0.43 ± 0.10, which are very different from those predicted by the local growth models and are not related to any known universality classes. The observed anomalous scaling pattern, characterized by power law scaling dependence of interface width on deposition time differently at local and global scale, with rapid roughening of the growth front has been discussed to arise as a consequence of a nonlocal effect in the form of diffusional instability.

PubMed Disclaimer

Figures

Figure 1
Figure 1. 2 μm × 2 μm AFM images of CBD CdS thin films grown under identical experimental conditions for different durations and the corresponding line profiles across the scan areas.
Figure 2
Figure 2. Log-log plot of the height-height correlation function G(r, t) estimated for the films of different deposition times.
Figure 3
Figure 3. Logarithmic plots of (a) lateral correlation length ξ and (b) interface width w versus deposition time.
In the bottom panel, solid circles () and open squares (□) represent the data points corresponding to global width and the local width, respectively. Solid lines in both panels are the linear fits to the data. The values of the slopes are indicated.
Figure 4
Figure 4. Logarithmic plot of G(r, t)/r versus r/tβ/α for different growth times showing a good data collapse of the height-height correlation function.
The solid lines are linear fits to the data points.
Figure 5
Figure 5. Logarithmic plot of power spectral density function S(k, t) versus wave number k for different growth times.
The slope of the curves for large k values is indicated. Inset: Time dependence curve of S(k, t) in the low k-regime. The line denotes the linear fit to the data points.

References

    1. Barabási L. & Stanley H. E. Fractal Concepts in Surface Growth (Cambridge University Press, 1995).
    1. Meakin P. Fractals, Scaling and Growth Far From Equilibrium (Cambridge University Press, 1998).
    1. Krim J. & Palasantzas G. Experimental observations of self-affine scaling and kinetic roughening at sub-micron length scales. Int. J. Mod. Phys. B 9, 599–632 (1995).
    1. Munoz M. A. Multiplicative noise in non-equilibrium phase transitions: A tutorial In Advances in Condensed Matter and Statistical Physics , (eds Korutcheva E. & Cuerno R. ) 37–68 (Nova Science, 2004).
    1. Steudel S. et al.. Influence of the dielectric roughness on the performance of pentacene transistors. App. Phys. Lett. 85, 4400–4402 (2004).

Publication types

LinkOut - more resources