The robustness of the terminal decline phenomenon: longitudinal data from the Digit-Span Memory Test
- PMID: 2809113
- DOI: 10.1093/geronj/44.6.p184
The robustness of the terminal decline phenomenon: longitudinal data from the Digit-Span Memory Test
Abstract
The robustness of terminal decline was studied by analyzing longitudinal results from the simple Digit-Span Memory Test. The subjects participated in the Gothenburg longitudinal study and were first examined at the age of 70. Analyses were conducted for different groups according to subsequent survival. The findings provided support for the robustness of the terminal decline phenomenon.
Publication types
MeSH terms
LinkOut - more resources
Medical