Nano-Electrochemistry and Nano-Electrografting with an Original Combined AFM-SECM
- PMID: 28348337
- PMCID: PMC5327889
- DOI: 10.3390/nano3020303
Nano-Electrochemistry and Nano-Electrografting with an Original Combined AFM-SECM
Abstract
This study demonstrates the advantages of the combination between atomic force microscopy and scanning electrochemical microscopy. The combined technique can perform nano-electrochemical measurements onto agarose surface and nano-electrografting of non-conducting polymers onto conducting surfaces. This work was achieved by manufacturing an original Atomic Force Microscopy-Scanning ElectroChemical Microscopy (AFM-SECM) electrode. The capabilities of the AFM-SECM-electrode were tested with the nano-electrografting of vinylic monomers initiated by aryl diazonium salts. Nano-electrochemical and technical processes were thoroughly described, so as to allow experiments reproducing. A plausible explanation of chemical and electrochemical mechanisms, leading to the nano-grafting process, was reported. This combined technique represents the first step towards improved nano-processes for the nano-electrografting.
Keywords: AFM; AFM-SECM; SECM; interface; nano-electrochemistry; nano-electrografting; nano-functionalization; nano-process; surface.
Figures









References
-
- Bard A.J., Mirkin M.V. Scanning Electrochemical Microscopy. Marcel Dekker; New York, NY, USA: 2001.
-
- Mirkin M.V., Horrocks B.R. Electroanalytical measurements using the scanning electrochemical microscope. Anal. Chim. Acta. 2000;406:119–146. doi: 10.1016/S0003-2670(99)00630-3. - DOI
-
- Jones C.E., Macpherson J.V., Barber Z.H., Somekh R.E., Unwin P.R. Simultaneous topographical and amperometric imaging of surfaces in air: Towards a combined scanning force-scanning electrochemical microscope (SF-SECM) Electrochem. Commun. 1999;1:55–60.
LinkOut - more resources
Full Text Sources
Other Literature Sources
Miscellaneous