Rapid visualization of grain boundaries in monolayer MoS2 by multiphoton microscopy
- PMID: 28580960
- PMCID: PMC5465365
- DOI: 10.1038/ncomms15714
Rapid visualization of grain boundaries in monolayer MoS2 by multiphoton microscopy
Abstract
Grain boundaries have a major effect on the physical properties of two-dimensional layered materials. Therefore, it is important to develop simple, fast and sensitive characterization methods to visualize grain boundaries. Conventional Raman and photoluminescence methods have been used for detecting grain boundaries; however, these techniques are better suited for detection of grain boundaries with a large crystal axis rotation between neighbouring grains. Here we show rapid visualization of grain boundaries in chemical vapour deposited monolayer MoS2 samples with multiphoton microscopy. In contrast to Raman and photoluminescence imaging, third-harmonic generation microscopy provides excellent sensitivity and high speed for grain boundary visualization regardless of the degree of crystal axis rotation. We find that the contrast associated with grain boundaries in the third-harmonic imaging is considerably enhanced by the solvents commonly used in the transfer process of two-dimensional materials. Our results demonstrate that multiphoton imaging can be used for fast and sensitive characterization of two-dimensional materials.
Conflict of interest statement
The authors declare no competing financial interests.
Figures
peak, (c) centre position of
peak, (d) intensity of A1g peak and (e) centre position of A1g peak, (f) PL spectra from the middle of the grain A1 (red curve, taken from the area marked with white line in g and from GB1 in the middle of the flake (black curve, taken from the area marked with a black dashed line in g. (g) PL intensity image of the 680 nm peak and (h) centre position of the 680 nm peak. Intensities and peak positions are acquired by Gaussian fitting. Scale bars, 10 μm. Colour scale bars are in CCD counts (Raman and PL intensities), in cm−1 (Raman peak positions) and in nm (PL peak position).References
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