Indepth distributions of elements in teeth, determined by ion probe analysis

Abstract

The technique of secondary ion mass spectrometry has been applied to dental hard tissue. The method offers high sensitivity (ppb-ppm) to most elements, a topographic surface resolution of about 1 micron, and a practical depth resolution in the 10 nm range. Quantitative analysis has entailed the use of external standards or the adaptation of a thermodynamic model of the secondary ionization mechanism. The intrinsic mass spectra of secondary ions from apatite material have been studied to assess the practical detection limits for most elements of the periodic table. Fluorine studies have been performed on enamel subjected to different prophylactic treatments. The atomic mechanism of fluorine mobility in teeth have been studied in diffusion anneals. The distributions of different elements (F, Cl, P, Li, Na, K, Rb, Mg, Sr, Ba, Al, C, Pb) have been investigated in dependence of depth in the enamel and dentin from different environments.