Skip to main page content
U.S. flag

An official website of the United States government

Dot gov

The .gov means it’s official.
Federal government websites often end in .gov or .mil. Before sharing sensitive information, make sure you’re on a federal government site.

Https

The site is secure.
The https:// ensures that you are connecting to the official website and that any information you provide is encrypted and transmitted securely.

Access keys NCBI Homepage MyNCBI Homepage Main Content Main Navigation
. 2018 Oct 10;9(1):4197.
doi: 10.1038/s41467-018-06596-1.

Low threshold and efficient multiple exciton generation in halide perovskite nanocrystals

Affiliations

Low threshold and efficient multiple exciton generation in halide perovskite nanocrystals

Mingjie Li et al. Nat Commun. .

Abstract

Multiple exciton generation (MEG) or carrier multiplication, a process that spawns two or more electron-hole pairs from an absorbed high-energy photon (larger than two times bandgap energy Eg), is a promising way to augment the photocurrent and overcome the Shockley-Queisser limit. Conventional semiconductor nanocrystals, the forerunners, face severe challenges from fast hot-carrier cooling. Perovskite nanocrystals possess an intrinsic phonon bottleneck that prolongs slow hot-carrier cooling, transcending these limitations. Herein, we demonstrate enhanced MEG with 2.25Eg threshold and 75% slope efficiency in intermediate-confined colloidal formamidinium lead iodide nanocrystals, surpassing those in strongly confined lead sulfide or lead selenide incumbents. Efficient MEG occurs via inverse Auger process within 90 fs, afforded by the slow cooling of energetic hot carriers. These nanocrystals circumvent the conundrum over enhanced Coulombic coupling and reduced density of states in strongly confined nanocrystals. These insights may lead to the realization of next generation of solar cells and efficient optoelectronic devices.

PubMed Disclaimer

Conflict of interest statement

The authors declare no competing interests.

Figures

Fig. 1
Fig. 1
Size-dependent bandgaps and biexciton lifetimes of FAPbI3 NCs. a Normalized PL spectra of FAPbI3 NCs in toluene with different sizes (emission peak positions are listed in Supplementary Table 1) and the FAPbI3 polycrystalline bulk-film counterpart. b Bandgap energies (black dots) as a function of the edge length of FAPbI3 NCs together with fitting using Supplementary Eq. (1) (red solid line). The vertical blue dashed line indicates the position of exciton Bohr diameter (Dx). Error bars correspond to the NC size distribution and uncertainty in the measurements of TA spectra. c Biexciton Auger-lifetime (black circles) as a function of NC volume. The horizontal and vertical error bars correspond to the NC size distribution and the uncertainty in the fitting procedure, respectively. The red square is obtained from ref. (Fang et al)
Fig. 2
Fig. 2
MEG QY determination from TA dynamics. a Normalized (norm.) band-edge PB dynamics under different pump photon energies with <N0> = 0.24 in 7.5 nm-sized FAPbI3 NCs. Inset shows the similar measurements for the bulk-counterpart with pump fluence of 2 × 1017 cm−3. TA dynamics generated by photon energy of (b) 1.51Eg and (c) 2.70Eg for 7.5-nm sized NCs with different average number of absorbed photons per NC <N0>. Solid black lines are single exponential in (b) and biexponential fittings in (c), respectively. df RPOP as a function of <N0> under photon energies below and above MEG threshold for three different sized FAPbI3 NCs. RPOP is determined by the PB intensity ratio at the beginning of pump excitation at a delay time of 2 ps to that at a delay time of 4 ns and fitted with Eq. (1) (solid lines). The error bars in df represent the uncertainties in the determination of TA amplitudes in the fitting procedure of TA dynamics
Fig. 3
Fig. 3
MEG threshold and slope efficiency determination. a MEG QY as a function of relative pump photon energies (/Eg) for FAPbI3 NCs of different edge lengths and bulk-counterpart. b Comparison of MEG QY vs. /Eg with PbSe NCs (from ref. ) and PbS NCs (Eg = 1.3 eV) as a reference measured using the same setup. The error bars in a, b represent the uncertainties in the MEG QY fitting procedure. c Detailed balance calculations for maximum PCEs under AM1.5 solar illumination as a function of material Eg for different MEG thresholds. The Shockley–Queisser limit is denoted as SQ
Fig. 4
Fig. 4
Slower hot-carrier cooling in smaller FAPbI3 NCs. a Schematic for hot-carrier cooling (left) below MEG threshold and (right) above the MEG threshold. b Normalized band-edge PB dynamics in colloidal 7.5 nm-sized FAPbI3 NCs and their bulk-counterpart (inset) under different pump wavelengths. The dashed lines are single exponential fits. c Band-edge PB buildup-time of FAPbI3 NCs (7.5 nm (blue circles); 12.9 nm (red triangles)), polycrystalline bulk-film (black square), and PbS NCs (yellowish-brown diamonds) measured at different pump photon energies. Gray region indicates the energies below ideal MEG threshold of 2Eg. d Hot-carrier cooling time as a function of converted real excess energies of carriers in FAPbI3 NCs. The error bars in (c) and (d) represent the uncertainty in the fitting procedure for the rise time

References

    1. Hanna MC, Nozik AJ. Solar conversion efficiency of photovoltaic and photoelectrolysis cells with carrier multiplication absorbers. J. Appl. Phys. 2006;100:074510. doi: 10.1063/1.2356795. - DOI
    1. Werner JH, Kolodinski S, Queisser HJ. Novel optimization principles and efficiency limits for semiconductor solar-cells. Phys. Rev. Lett. 1994;72:3851–3854. doi: 10.1103/PhysRevLett.72.3851. - DOI - PubMed
    1. Robbins DJ. Aspects of the theory of impact ionization in semiconductors (I) Phys. Status Solidi B. 1980;97:9–50. doi: 10.1002/pssb.2220970102. - DOI
    1. Kolodinski S, Werner JH, Wittchen T, Queisser HJ. Quantum efficiencies exceeding unity due to impact ionization in silicon solar-cells. Appl. Phys. Lett. 1993;63:2405–2407. doi: 10.1063/1.110489. - DOI
    1. Wolf M, Brendel R, Werner JH, Queisser HJ. Solar cell efficiency and carrier multiplication in Si1−xGex alloys. J. Appl. Phys. 1998;83:4213–4221. doi: 10.1063/1.367177. - DOI

Publication types

Grants and funding