A simple atomic force microscope-based method for quantifying wear of sliding probes

Abstract

Sliding wear is particularly problematic for micro- and nano-scale devices and applications, and is often studied at the small scale to develop practical and fundamental insights. While many methods exist to measure and quantify the wear of a sliding atomic force microscope (AFM) probe, many of these rely on specialized equipment and/or assumptions from continuum mechanics. Here we present a methodology that enables simple, purely AFM-based measurement of wear, in cases where the AFM probe wears to a flat plateau. The rate of volume removal is recast into a form that depends primarily on the time-varying contact area. This contact area is determined using images of sharp spikes, which are analyzed with a simple thresholding technique, rather than requiring sophisticated computer algorithms or continuum mechanics assumptions. This approach enables the rapid determination of volume lost, rate of material removal, normal stress, and interfacial shear stress at various points throughout the wear experiment. The method is demonstrated using silicon probes sliding on an aluminum oxide substrate. As a validation for the present method, direct imaging in the transmission electron microscope is used to verify the method's parameters and results. Overall, it is envisioned that this purely AFM-based methodology will enable higher-throughput wear experiments and direct hypothesis-based investigation into the science of wear and its dependence on different variables.