Towards data-driven next-generation transmission electron microscopy

Steven R Spurgeon¹, Colin Ophus², Lewys Jones^{3

4}, Amanda Petford-Long⁵, Sergei V Kalinin⁶, Matthew J Olszta⁷, Rafal E Dunin-Borkowski⁸, Norman Salmon⁹, Khalid Hattar¹⁰, Wei-Chang D Yang¹¹, Renu Sharma¹¹, Yingge Du¹², Ann Chiaramonti¹³, Haimei Zheng¹⁴, Edgar C Buck⁷, Libor Kovarik¹², R Lee Penn¹⁵, Dongsheng Li¹², Xin Zhang¹², Mitsuhiro Murayama¹⁶, Mitra L Taheri¹⁷

Affiliations

¹ Energy and Environment Directorate, Pacific Northwest National Laboratory, Richland, WA, USA. steven.spurgeon@pnnl.gov.
² National Center for Electron Microscopy, Molecular Foundry, Lawrence Berkeley National Laboratory, Berkeley, CA, USA.
³ Advanced Microscopy Laboratory, Centre for Research on Adaptive Nanostructures and Nanodevices (CRANN), Dublin, Ireland.
⁴ School of Physics, Trinity College Dublin, The University of Dublin, Dublin, Ireland.
⁵ Materials Science Division, Argonne National Laboratory, Argonne, IL, USA.
⁶ Center for Nanophase Materials Sciences, Oak Ridge National Laboratory, Oak Ridge, TN, USA.
⁷ Energy and Environment Directorate, Pacific Northwest National Laboratory, Richland, WA, USA.
⁸ Ernst Ruska-Centre for Microscopy and Spectroscopy with Electrons and Peter Grünberg Institute, Forschungszentrum Jülich, Jülich, Germany.
⁹ Hummingbird Scientific, Lacey, WA, USA.
¹⁰ Center for Integrated Nanotechnologies, Sandia National Laboratories, Albuquerque, NM, USA.
¹¹ Physical Measurement Laboratory, National Institute of Standards and Technology, Gaithersburg, MD, USA.
¹² Physical and Computational Sciences Directorate, Pacific Northwest National Laboratory, Richland, WA, USA.
¹³ Applied Chemicals and Materials Division, Material Measurement Laboratory, National Institute of Standards and Technology, Boulder, CO, USA.
¹⁴ Materials Sciences Division, Lawrence Berkeley National Laboratory, Berkeley, CA, USA.
¹⁵ Department of Chemistry, University of Minnesota, Minneapolis, MN, USA.
¹⁶ Department of Materials Science and Engineering, Virginia Tech, Blacksburg, VA, USA.
¹⁷ Department of Materials Science and Engineering, Johns Hopkins University, Baltimore, MD, USA. mtaheri4@jhu.edu.

PMID: 33106651
PMCID: PMC8485843
DOI: 10.1038/s41563-020-00833-z

Review

Towards data-driven next-generation transmission electron microscopy

Steven R Spurgeon et al. Nat Mater. 2021 Mar.

. 2021 Mar;20(3):274-279.

doi: 10.1038/s41563-020-00833-z.

Authors

Affiliations

¹ Energy and Environment Directorate, Pacific Northwest National Laboratory, Richland, WA, USA. steven.spurgeon@pnnl.gov.
² National Center for Electron Microscopy, Molecular Foundry, Lawrence Berkeley National Laboratory, Berkeley, CA, USA.
³ Advanced Microscopy Laboratory, Centre for Research on Adaptive Nanostructures and Nanodevices (CRANN), Dublin, Ireland.
⁴ School of Physics, Trinity College Dublin, The University of Dublin, Dublin, Ireland.
⁵ Materials Science Division, Argonne National Laboratory, Argonne, IL, USA.
⁶ Center for Nanophase Materials Sciences, Oak Ridge National Laboratory, Oak Ridge, TN, USA.
⁷ Energy and Environment Directorate, Pacific Northwest National Laboratory, Richland, WA, USA.
⁸ Ernst Ruska-Centre for Microscopy and Spectroscopy with Electrons and Peter Grünberg Institute, Forschungszentrum Jülich, Jülich, Germany.
⁹ Hummingbird Scientific, Lacey, WA, USA.
¹⁰ Center for Integrated Nanotechnologies, Sandia National Laboratories, Albuquerque, NM, USA.
¹¹ Physical Measurement Laboratory, National Institute of Standards and Technology, Gaithersburg, MD, USA.
¹² Physical and Computational Sciences Directorate, Pacific Northwest National Laboratory, Richland, WA, USA.
¹³ Applied Chemicals and Materials Division, Material Measurement Laboratory, National Institute of Standards and Technology, Boulder, CO, USA.
¹⁴ Materials Sciences Division, Lawrence Berkeley National Laboratory, Berkeley, CA, USA.
¹⁵ Department of Chemistry, University of Minnesota, Minneapolis, MN, USA.
¹⁶ Department of Materials Science and Engineering, Virginia Tech, Blacksburg, VA, USA.
¹⁷ Department of Materials Science and Engineering, Johns Hopkins University, Baltimore, MD, USA. mtaheri4@jhu.edu.

PMID: 33106651
PMCID: PMC8485843
DOI: 10.1038/s41563-020-00833-z

Abstract

Electron microscopy touches on nearly every aspect of modern life, underpinning materials development for quantum computing, energy and medicine. We discuss the open, highly integrated and data-driven microscopy architecture needed to realize transformative discoveries in the coming decade.

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Conflict of interest statement

Competing interests

The authors declare no competing interests.

Figures

**Fig. 1 |. The electron microscopy framework.**
The framework for translating unknown structures or processes into quantifiable, physically meaningful descriptors and model representations.

**Fig. 2 |. Microscopy data-production rates and analysis workflows.**
a, Effective maximum microscope data-production rates by year, showing the rapid increase associated with better detector technologies. Estimates are constrained by the overhead associated with processing and transfer of data. b, Present and emerging microscopy analysis workflows harnessing new methods of data collection and interpretation.

See this image and copyright information in PMC

References

1. Ruska E Rev. Mod. Phys 59, 627–638 (1987).
1. Shen PS Anal. Bioanal. Chem 410, 2053–2057 (2018). - PubMed
1. Shechtman D, Blech I, Gratias D & Cahn JW Phys. Rev. Lett 53, 1951–1953 (1984).
1. Varela M et al.Annu. Rev. Mater. Res 35, 539–569 (2005).
1. Butler KT, Davies DW, Cartwright H, Isayev O & Walsh A Nature 559, 547–555 (2018). - PubMed

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Towards data-driven next-generation transmission electron microscopy

Affiliations

Towards data-driven next-generation transmission electron microscopy

Authors

Affiliations

Abstract

Conflict of interest statement

Figures

References

Publication types

Grants and funding

LinkOut - more resources

Full Text Sources