Can EEG Be Adopted as a Neuroscience Reference for Assessing Software Programmers' Cognitive Load?
- PMID: 33801660
- PMCID: PMC8037053
- DOI: 10.3390/s21072338
Can EEG Be Adopted as a Neuroscience Reference for Assessing Software Programmers' Cognitive Load?
Abstract
An emergent research area in software engineering and software reliability is the use of wearable biosensors to monitor the cognitive state of software developers during software development tasks. The goal is to gather physiologic manifestations that can be linked to error-prone scenarios related to programmers' cognitive states. In this paper we investigate whether electroencephalography (EEG) can be applied to accurately identify programmers' cognitive load associated with the comprehension of code with different complexity levels. Therefore, a controlled experiment involving 26 programmers was carried. We found that features related to Theta, Alpha, and Beta brain waves have the highest discriminative power, allowing the identification of code lines and demanding higher mental effort. The EEG results reveal evidence of mental effort saturation as code complexity increases. Conversely, the classic software complexity metrics do not accurately represent the mental effort involved in code comprehension. Finally, EEG is proposed as a reference, in particular, the combination of EEG with eye tracking information allows for an accurate identification of code lines that correspond to peaks of cognitive load, providing a reference to help in the future evaluation of the space and time accuracy of programmers' cognitive state monitored using wearable devices compatible with software development activities.
Keywords: bio-signal processing; biofeedback; electroencephalogram; human error; software engineering.
Conflict of interest statement
The authors declare no conflict of interest.
Figures











References
-
- McConnell S.C. Code Complete: A Practical Handbook of Software Construction. Microsoft Press; Redmond, WA, USA: 2004.
-
- Shah S.M.A., Morisio M., Torchiano M. The impact of process maturity on defect density; Proceedings of the 2012 ACM-IEEE International Symposium on Empirical Software Engineering and Measurement; Lund, Sweden. 19–20 September 2012; New York, NY, USA: ACM/IEEE; 2012. pp. 315–318. - DOI
-
- Boehm B., Port D., Jain A., Basili V. Achieving CMMI Level 5 improvements with MBASE and the CeBASE method. CrossTalk. 2002;15:9–16.
-
- Honda N., Yamada S. Empirical Analysis for High Quality SW Development. Am. J. Oper. Res. 2012 doi: 10.4236/ajor.2012.21004. - DOI
-
- Zhang H. An investigation of the relationships between lines of code and defects; Proceedings of the 2009 IEEE International Conference on Software Maintenance; Edmonton, AB, Canada. 20–26 September 2009; pp. 274–283. - DOI
MeSH terms
Grants and funding
LinkOut - more resources
Full Text Sources
Other Literature Sources