Correction to "Imaging Nanometer Phase Coexistence at Defects During the Insulator-Metal Phase Transformation in VO2 Thin Films by Resonant Soft X-ray Holography"
- PMID: 34410135
- DOI: 10.1021/acs.nanolett.1c03109
Correction to "Imaging Nanometer Phase Coexistence at Defects During the Insulator-Metal Phase Transformation in VO2 Thin Films by Resonant Soft X-ray Holography"
Erratum for
-
Imaging Nanometer Phase Coexistence at Defects During the Insulator-Metal Phase Transformation in VO2 Thin Films by Resonant Soft X-ray Holography.Nano Lett. 2018 Jun 13;18(6):3449-3453. doi: 10.1021/acs.nanolett.8b00458. Epub 2018 May 18. Nano Lett. 2018. PMID: 29767985
Publication types
LinkOut - more resources
Full Text Sources
