Widefield SERS for High-Throughput Nanoparticle Screening
- PMID: 35107845
- DOI: 10.1002/anie.202200072
Widefield SERS for High-Throughput Nanoparticle Screening
Abstract
Surface-enhanced Raman scattering (SERS) imaging is a powerful technology with unprecedent potential for ultrasensitive chemical analysis. Point-by-point scanning and often excessively long spectral acquisition-times hamper the broad exploitation of the full analytical potential of SERS. Here, we introduce large-scale SERS particle screening (LSSPS), a multiplexed widefield screening approach to particle characterization, which is 500-1000 times faster than typical confocal Raman implementations. Beyond its higher throughput, LSSPS simultaneously quantifies both the sample's Raman and Rayleigh scattering to directly quantify the fraction of SERS-active particles which allows for an unprecedented correlation of SERS activity with particle size. .
Keywords: Imaging; Nanoparticles; SERS; Widefield Microscopy.
© 2022 Wiley-VCH GmbH.
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