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. 2022 Aug 18;15(8):1266-1272.
doi: 10.18240/ijo.2022.08.07. eCollection 2022.

Monitoring of central corneal thickness after phacoemulsification-comparison of statical and rotating Scheimpflug pachymetry, and spectral-domain OCT

Affiliations

Monitoring of central corneal thickness after phacoemulsification-comparison of statical and rotating Scheimpflug pachymetry, and spectral-domain OCT

Daniel M Handzel et al. Int J Ophthalmol. .

Abstract

Aim: To explore the possibility of deploying three contactless devices (static and rotating Scheimpflug technology, spectral domain optical coherence tomography) for measuring central corneal thickness (CCT) in preoperative and postoperative examinations of cataract patients.

Methods: Totally 72 patients who had undergone surgery without complications were selected. The CCT was measured prior to the operation, as well as on the first, 5th-7th and 28th day following the operation using the Nidek NT 530-P, Sirius®, and Topcon OCT-2000 devices.

Results: A significant postoperative increase and subsequent decrease in CCT was identified with all three devices. The correlations were highly significant and thus reflect a very good degree of comparability at all times with the exception of the rotating Scheimpflug camera. The postoperative results from the latter differed significantly from the other devices. The correlations were Sirius/Topcon (P=0.010) and Sirius/Nidek (P<0.0005). No statistically significant difference could be identified in the comparison between Topcon and Nidek (P=0.056).

Conclusion: All three devices are suitable for postoperative monitoring of CCT. The measurement results are only comparable to a limited extent and not interchangeable in the course of treating a single patient. This is due to the different imaging technology used in the devices and the resulting modalities for conducting the measurements.

Keywords: Scheimpflug imaging; cataract surgery; corneal thickness; optical coherence tomography; pachymetry.

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Figures

Figure 1
Figure 1. Display of CCT in µm (Y-axis) with the three devices at different points of time (X-axis).

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