Advanced Optical Characterization of PEDOT:PSS by Combining Spectroscopic Ellipsometry and Raman Scattering
- PMID: 36340176
- PMCID: PMC9631752
- DOI: 10.1021/acsomega.2c05945
Advanced Optical Characterization of PEDOT:PSS by Combining Spectroscopic Ellipsometry and Raman Scattering
Abstract
The optical properties of various PEDOT:PSS films obtained by drop casting and blade coating are analyzed by variable-angle spectroscopic ellipsometry in the visible-UV spectral range. We discuss observed differences in the optical spectra due to PSS content and DMSO treatment and correlate them to structural changes extracted from Raman measurements. In particular, we investigate the optical anisotropy of the complex refractive indices which arises from the in-plane arrangement of the PEDOT backbones, giving rise to optically uniaxial behavior with the optic axis perpendicular to the film plane. Although this is widely accepted, most investigations disregard the anisotropy for simplicity, which sometimes leads to inaccurate conclusions. In this work, we compare the results of isotropic and anisotropic analyses to clarify which kind of errors we can expect if anisotropy is not considered. Finally, the correlation between Raman scattering and ellipsometric analyses shows that not only local structural changes of the chain conformation but also the overall morphology of the composite films are significant in the interpretation of Raman spectra.
© 2022 The Authors. Published by American Chemical Society.
Conflict of interest statement
The authors declare no competing financial interest.
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