Strain-Induced Plasmon Confinement in Polycrystalline Graphene
- PMID: 36820323
- PMCID: PMC9936574
- DOI: 10.1021/acsphotonics.2c01157
Strain-Induced Plasmon Confinement in Polycrystalline Graphene
Abstract
Terahertz spectroscopy is a perfect tool to investigate the electronic intraband conductivity of graphene, but a phenomenological model (Drude-Smith) is often needed to describe disorder. By studying the THz response of isotropically strained polycrystalline graphene and using a fully atomistic computational approach to fit the results, we demonstrate here the connection between the Drude-Smith parameters and the microscopic behavior. Importantly, we clearly show that the strain-induced changes in the conductivity originate mainly from the increased separation between the single-crystal grains, leading to enchanced localization of the plasmon excitations. Only at the lowest strain values explored, a behavior consistent with the deformation of the individual grains can instead be observed.
© 2023 The Authors. Published by American Chemical Society.
Conflict of interest statement
The authors declare no competing financial interest.
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