Safeguarding wheat yields from cereal fungal invaders in the postgenomic era

Abstract

Wheat production is under constant threat from pests and pathogens, with fungal foliar diseases causing considerable annual yield losses. However, recent improvements in genomic tools and resources provide an unprecedented opportunity to enhance wheat's resilience in the face of these biotic constraints. Here, we discuss the impact of these advances on three key areas of managing fungal diseases of wheat: (i) enhancing the abundance of resistance traits available for plant breeding, (ii) accelerating the identification of novel fungicide targets and (iii) developing better tools for disease diagnostics and surveillance. Embracing these new genomics-led technological innovations in crop protection could revolutionise our wheat production system to improve resilience and prevent yield losses.