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. 2023 Jun 2;9(22):eadg8659.
doi: 10.1126/sciadv.adg8659. Epub 2023 Jun 2.

Achieving ideal transistor characteristics in conjugated polymer semiconductors

Affiliations

Achieving ideal transistor characteristics in conjugated polymer semiconductors

Mingfei Xiao et al. Sci Adv. .

Abstract

Organic thin-film transistors (OTFTs) with ideal behavior are highly desired, because nonideal devices may overestimate the intrinsic property and yield inferior performance in applications. In reality, most polymer OTFTs reported in the literature do not exhibit ideal characteristics. Supported by a structure-property relationship study of several low-disorder conjugated polymers, here, we present an empirical selection rule for polymer candidates for textbook-like OTFTs with high reliability factors (100% for ideal transistors). The successful candidates should have low energetic disorder along their backbones and form thin films with spatially uniform energetic landscapes. We demonstrate that these requirements are satisfied in the semicrystalline polymer PffBT4T-2DT, which exhibits a reliability factor (~100%) that is exceptionally high for polymer devices, rendering it an ideal candidate for OTFT applications. Our findings broaden the selection of polymer semiconductors with textbook-like OTFT characteristics and would shed light upon the molecular design criteria for next-generation polymer semiconductors.

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Figures

Fig. 1.
Fig. 1.. Molecular structures and energetic disorder of conjugated polymers.
(A) Molecular structures of IDT-BT, PffBT4T-2DT, and N2200. (B) PDS spectrum of PffBT4T-2DT thin film with extracted EU. a.u., arbitrary units. (C) ER-EIS of four different polymers (IDT-BT, N2200, PBTTT, and PffBT4T-2DT). For p-type IDT-BT, PBTTT, and PffBT4T-2DT, their highest occupied molecular orbital bands are probed; for n-type N2200, its lowest unoccupied molecular orbital band is probed. The characteristic band tail broadening energy is defined as the inverse of the slope. (D) Distribution of local PL COM compared with bulk PL COM of four different polymers.
Fig. 2.
Fig. 2.. Analysis of GIWAXS and carbon K-edge NEXAFS spectra of PffBT4T-2DT films.
(A) 2D GIWAXS patterns of spin-coated PffBT4T-2DT films (αc = critical angle of the thin film, αi = incidence angle of the x-ray beam). (B) Corresponding GIWAXS line profile along the in-plane/out-of-plane directions. (C) Population ratio analysis of edge-on, face-on, and isotropic crystals. (D) Total electron yield (TEY) mode NEXAFS spectra with four incidence angles (θ) for the top surface of PffBT4T-2DT films (left) and the π* NEXAFS spectra intensity as a function of cos2(θ) with linear fitting (right).
Fig. 3.
Fig. 3.. Performance of OTFTs based on PffBT4T-2DT.
(A and D) Linear and saturation transfer curves measured on a representative top-gate, bottom-contact OTFT (L = 20 μm, W = 1 mm) fabricated from spin-coated, as cast PffBT4T-2DT films. (B and E) Linear and saturation mobility calculated from the transfer curves measured on the same device. (C and F) Output curves measured on the same device. (D) to (F) Transfer curves, mobility, and output curves measured after 50 days of air exposure. (G) Reliability factor of the device shown in (D): The red line is the linear fit of the transfer curve, and the blue line represents an ideal transistor showing the same maximum current but following the standard transistor equations. (H) Temperature-dependent saturation mobility calculated from the transfer curves measured on the same device. (I) Activation energy of device extracted from the temperature-dependent saturation mobility at VG = −60 V.
Fig. 4.
Fig. 4.. Seebeck measurements of OTFTs based on PffBT4T-2DT.
(A) Seebeck coefficients versus the logarithm of carrier concentration for PffBT4T-2DT OTFT at 295 K. (B) Temperature-dependent Seebeck coefficient versus the logarithm of carrier concentration for PffBT4T-2DT OTFT.

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