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. 2024 Mar 27;16(12):15596-15604.
doi: 10.1021/acsami.4c00458. Epub 2024 Mar 18.

Strain-Enhanced Large-Area Monolayer MoS2 Photodetectors

Affiliations

Strain-Enhanced Large-Area Monolayer MoS2 Photodetectors

Borna Radatović et al. ACS Appl Mater Interfaces. .

Abstract

In this study, we show a direct correlation between the applied mechanical strain and an increase in monolayer MoS2 photoresponsivity. This shows that tensile strain can improve the efficiency of monolayer MoS2 photodetectors. The observed high photocurrent and extended response time in our devices are indicative that devices are predominantly governed by photogating mechanisms, which become more prominent with applied tensile strain. Furthermore, we have demonstrated that a nonencapsulated MoS2 monolayer can be used in strain-based devices for many cycles and extensive periods of time, showing endurance under ambient conditions without loss of functionality. Such robustness emphasizes the potential of MoS2 for further functionalization and utilization of different flexible sensors.

Keywords: MoS2; PL spectroscopy; atomic force microscopy; photocurrent spectroscopy; photodetector; strain; strain sensor.

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Conflict of interest statement

The authors declare no competing financial interest.

Figures

Figure 1
Figure 1
Uniformity characterization in the device channel. (a) Optical micrograph of the MoS2 monolayer transferred on top of the PC sheet with a prefabricated pair of Au electrodes. The MoS2 area over electrodes is indicated with a dashed red lines. (b) Microreflectance spectrum of the MoS2 monolayer in the channel. Exciton A and B Lorentzian fits and the cumulative fit are indicated with red, green, and blue lines, respectively. (c) PL map of the A exciton resonance of the device channel. Values taken as characteristic A exciton energies for MoS2 in the channel at the PC, MoS2 on the edge of the electrode, and MoS2 at Au electrodes are indicated with 1, 2, and 3, respectively. (d) AFM topographic image of the sample with no visible cracks in a 30 μm × 30 μm sized region. The blue arrows indicate transfer-induced contaminations. (e) Channel line profile taken along the white dashed arrow in (d).
Figure 2
Figure 2
Piezoresistive effect in the MoS2 monolayer. (a) IV characterization under different levels of applied ε up to 1%. (b) Evolution of current versus voltage during 20 bending cycles, where each cycle consists of 21 steps in which strain increases from 0% up to 0.6% and back to 0%, all in 0.06% increments, i.e., decrements. The applied voltage is shown on the Y-axis, a cycle number on the X-axis, and a measured current as a color scale. The red/blue color indicates the current measured under positive/negative bias, respectively. Darker shades of red and blue indicate the highest current (lowest resistance, under 0.6% of applied ε), while brighter corresponds to the lowest current (highest resistance, under 0% of applied ε). (c) Resistance vs cycle number, with an indicated green rectangle that shows the first three cycles after which prestrain is partially released. The maximum resistance in each cycle corresponds to 0% of applied ε while minimum to 0.6%. (d) GFP for each new half cycle over the 20 subsequent cycles of bending.
Figure 3
Figure 3
Strain-enhanced MoS2 photoresponse. (a) Optical microscopy image of the device under exposure to light. (b) Photoresponse of MoS2 at a light illumination of 645 nm, with the light turned on for 45 s and switched off afterward. Measured current and corresponding double exponential fits are shown for 0.0, 0.3, and 0.9% of tensile strain. (c) Photocurrent spectroscopy of the MoS2 monolayer sheet by exposure to the LED light with different wavelengths at 0.0, 0.03, and 0.09% of tensile strain. (d) Higher-resolution photocurrent spectroscopy of the MoS2 monolayer sheet with exposure to a continuous light source with different wavelengths at 0.0, 0.3, and 0.9% of tensile strain. Data show the energy range in which B (604 nm) and A (645 nm) exciton peaks are found and fitted with two Lorentzians.

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