A comprehensive review on application of atomic force microscopy in Forensic science

Abstract

The primary objective of forensic investigation of a case is to recognize, identify, locate, and examine the evidence. Microscopy is a technique that provides crucial information for resolving a case or advancing the investigation process by analyzing the evidence obtained from a crime scene. It is often used in conjunction with suitable analytical techniques. Various microscopes are employed; scanning probe microscopes are available in diverse forensic analyses and studies. Among these, the atomic force microscope (AFM) is the most commonly used scanning probe technology, offering a unique morphological and physico-chemical perspective for analyzing multiple pieces of evidence in forensic investigations. Notably, it is a non-destructive technique capable of operating in liquid or air without complex sample preparation. The article delves into a detailed exploration of the applications of AFM in the realms of nanomechanical forensics and nanoscale characterization of forensically significant samples.

Keywords: Atomic force microscopy (AFM); Fingerprint and questioned document (QD); Quartz grain; Surface morphology; Time since deposition (TSD).