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. 2024 Jul 29;14(33):23802-23815.
doi: 10.1039/d4ra03742a. eCollection 2024 Jul 26.

Innovative synthesis, structural characteristics, linear and nonlinear optical properties, and optoelectric parameters of newly developed A2ZnGeO4 (A = K, Li) thin films

Affiliations

Innovative synthesis, structural characteristics, linear and nonlinear optical properties, and optoelectric parameters of newly developed A2ZnGeO4 (A = K, Li) thin films

Sourour Ben Yahya et al. RSC Adv. .

Abstract

The synthesis of high-quality thin films through spin coating deposition on meticulously cleaned glass substrates is presented. Optical band gaps E g of both samples using the Kubelka-Munk function are determined. The data analysis uncovers the presence of optical allowed direct transition for A2ZnGeO4 (A = K, Li). Spectroscopic ellipsometry measurements on A2ZnGeO4 (A = K, Li) thin films and an analysis of their optical properties using the Cauchy model are presented. Furthermore, the increase of the thickness of the thin film results in improvements in their optoelectrical parameters, such as electrical conductivity, optical mobility, and optical conductivity. Using the Kubodera and Kobayashi comparative model, the third order nonlinear susceptibility (χ (3)) was estimated based on the compounds' high linear absorption of the generated third harmonic wavelength (355 nm). This paper presents remarkable NLO results that reveal potential uses in optoelectronics and photonics.

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Conflict of interest statement

There are no conflicts to declare.

Figures

Fig. 1
Fig. 1. Schematic diagram of synthesis of A2ZnGeO4 (A = K, Li) compounds.
Fig. 2
Fig. 2. XRD patterns of as-prepared (a) K2ZnGeO4 and (b) Li2ZnGeO4 compounds.
Fig. 3
Fig. 3. SEM image of K2ZnGeO4 (a) and Li2ZnGeO4 (b), along with the elemental analysis by EDX of K2ZnGeO4 (c) and Li2ZnGeO4 (d).
Fig. 4
Fig. 4. The TEM image of K2ZnGeO4 (a) and Li2ZnGeO4 (b) along with the particle size distribution of K2ZnGeO4 (c) and Li2ZnGeO4 (d).
Fig. 5
Fig. 5. Raman spectra of the phosphors (a) K2ZnGeO4, (b) Li2ZnGeO4.
Fig. 6
Fig. 6. The UV-vis absorbance spectrum A (λ) and dA/dλ as a function of λ in the inset for the phosphors K2ZnGeO4 (a) and Li2ZnGeO4 (b) at room temperature, spanning from 200 to 800 nm.
Fig. 7
Fig. 7. Plots of (αhν)2 as a function as of (a) K2ZnGeO4 and (b) Li2ZnGeO4.
Fig. 8
Fig. 8. Variation of ln(αhν) against ln(Eg) of (a) K2ZnGeO4 and (b) Li2ZnGeO4.
Fig. 9
Fig. 9. Determining the Urbach energy of the (a) K2ZnGeO4 and (b) Li2ZnGeO4.
Fig. 10
Fig. 10. Refractive index (a) and extinction coefficient (b) plots versus wavelength for K2ZnGeO4 and Li2ZnGeO4 compounds.
Fig. 11
Fig. 11. The (n2 − 1)−1 as a function of ()2 for K2ZnGeO4 (a) and Li2ZnGeO4 (b).
Fig. 12
Fig. 12. The (n2 − 1)−1 as a function of λ−2 for K2ZnGeO4 (a) and Li2ZnGeO4 (b).
Fig. 13
Fig. 13. The ε1 and ε2 against the λ of the (a) K2ZnGeO4 and (b) Li2ZnGeO4.
Fig. 14
Fig. 14. (a) The variation of ε1 with λ2 and (b) The ε2 against λ3 for the A2ZnGeO4 (K, Li).
Fig. 15
Fig. 15. (a) The variation of the optical conductivity and (b) the electrical conductivity versus the photon energy for the A2ZnGeO4 thin films.
Fig. 16
Fig. 16. Third harmonic intensity plotted against the incident angle for polarization P and S of K2ZnGeO4 film and silica (a) and (b) and Li2ZnGeO4 film and silica (c) and (d).

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