Development and testing of a dual-frequency real-time hardware feedback system for the hard X-ray nanoprobe beamline of the SSRF
- PMID: 39642103
- PMCID: PMC11708843
- DOI: 10.1107/S1600577524010208
Development and testing of a dual-frequency real-time hardware feedback system for the hard X-ray nanoprobe beamline of the SSRF
Abstract
A novel dual-frequency real-time feedback system has been developed to simultaneously optimize and stabilize beam position and energy at the hard X-ray nanoprobe beamline of the Shanghai Synchrotron Radiation Facility. A user-selected cut-off frequency is used to separate the beam position signal obtained from an X-ray beam position monitor into two parts, i.e. high-frequency and low-frequency components. They can be real-time corrected and optimized by two different optical components, one chromatic and the other achromatic, of very different inertial mass, such as Bragg monochromator dispersive elements and a pre-focusing total external reflection mirror. The experimental results shown in this article demonstrate a significant improvement in position and energy stabilities. The long-term beam angular stability clearly improved from 2.21 to 0.92 µrad RMS in the horizontal direction and from 0.72 to 0.10 µrad RMS in the vertical direction.
Keywords: FPGA; PID; X-ray; feedback; frequency domain.
open access.
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