Expression of concern: Structural, morphological, electrical, and dielectric properties of Na2Cu5(Si2O7)2 for ASSIBs
- PMID: 39720261
- PMCID: PMC11667217
- DOI: 10.1039/d4ra90155j
Expression of concern: Structural, morphological, electrical, and dielectric properties of Na2Cu5(Si2O7)2 for ASSIBs
Abstract
Expression of concern for 'Structural, morphological, electrical, and dielectric properties of Na2Cu5(Si2O7)2 for ASSIBs' by Mohamed Ben Bechir et al., RSC Adv., 2024, 14, 9228-9242, https://doi.org/10.1039/D4RA01454E.
This journal is © The Royal Society of Chemistry.
Expression of concern for
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Structural, morphological, electrical, and dielectric properties of Na2Cu5(Si2O7)2 for ASSIBs.RSC Adv. 2024 Mar 19;14(13):9228-9242. doi: 10.1039/d4ra01454e. eCollection 2024 Mar 14. RSC Adv. 2024. Retraction in: RSC Adv. 2025 May 14;15(20):16097. doi: 10.1039/d5ra90057c. PMID: 38505384 Free PMC article. Retracted.
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