Inline calibration of spatial light modulators in nonlinear microscopy

Abstract

We present a method for calibrating the response of a phase-only spatial light modulator in nonlinear microscopy. Our method uses the microscope image itself as a calibration measurement and requires no additional hardware components. It is adapted to the nonlinear signals encountered in multi-photon excitation fluorescence microscopes and works well even under low-light conditions and with strong photobleaching.