Light-Induced Depletion-Region Modulation in a PtTe2/Ga2O3 Schottky Junction Field-Effect Transistor for Solar-Blind UV Detection
- PMID: 41728895
- DOI: 10.1021/acsnano.5c21841
Light-Induced Depletion-Region Modulation in a PtTe2/Ga2O3 Schottky Junction Field-Effect Transistor for Solar-Blind UV Detection
Abstract
The solar-blind phototransistor is a three-terminal device capable of substantially suppressing dark current and reducing noise solely through gate-voltage modulation. In this work, we report a top-gate β-Ga2O3 metal-semiconductor field-effect transistor employing a semimetal PtTe2 gate that forms a dielectric-free van der Waals (vdW) Schottky contact with the channel. The corresponding transistor exhibits a minimal hysteresis of 80 mV, an extremely low OFF-state current of ≈10 fA, and an ON/OFF current ratio exceeding 108. The phototransistor demonstrates excellent device performance in terms of a record-high photo-to-dark current ratio of 1.13 × 109, a high responsivity of 6.75 × 104 A/W, a large external quantum efficiency of 3.3 × 107 %, and a high specific detectivity of 4.46 × 1015 Jones. These excellent characteristics are attributed to the top-gate-induced modulation of the depletion region, which suppresses dark current, and to the enhanced photocurrent generated by the synergistic response of the PtTe2/β-Ga2O3 interface under illumination. The PtTe2/β-Ga2O3 phototransistor provides a promising pathway toward high-responsivity and high-detectivity solar-blind optoelectronics.
Keywords: Ga2O3; PtTe2; deep ultraviolet; photodetection; phototransistor.
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