The interpretation of low-angle X-ray data from planar and concentric multilayered structures. The use of one-dimensional electron density strip models
- PMID: 5764230
- PMCID: PMC1367429
- DOI: 10.1016/S0006-3495(69)86381-2
The interpretation of low-angle X-ray data from planar and concentric multilayered structures. The use of one-dimensional electron density strip models
Abstract
The use of one-dimensional electron density strip models in interpreting low-angle X-ray data from planar and concentric multilayered structures is described. Diffraction formulas for an n-strip model are given. Fourier transforms, normalization constants, and Patterson functions are derived for certain strip models.
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