Noise characteristics of a microchannel plate x-ray image intensifier

Abstract

The noise performance of an experimental microchannel plate x-ray image intensifier has been evaluated. The intensifier, constructed for use with photons of energies between 20 and 150 keV, uses an MCP as the photon-to-electron converter. The influence of noise was determined by analysis of the optical-density fluctuations of a photograph of the viewing screen of the intensifier when the conversion layer was exposed to between 1 and 60 mR. Additionally, the contrast-detail performance of the experimental device was determined. The influence of both stochastic noise, due to quantum mottle and pulse-height variations, and structural noise, due to fluctuations in inherent gain from point to point, have been considered by using a model that adds these components.