Transformation of stimulus information from very short-term memory

Abstract

Observers were shown a simple stimulus pattern, a mask pattern, and a test pattern on each trial. Different types of test patterns were used to assess transformations of material from very short-term memory. The durations of the initial stimulus pattern and the mask pattern were also varied. Significant differences in average response data were found between types of test pattern over exposure durations; however, sensitivity measures showed minimal differences between types of test pattern. This suggested some distinctions between input processing and response selection in the paradigm. Selective feature analysis seems to be a characteristic of response selection.