Motif detection in quantum noise-limited electron micrographs by cross-correlation
- PMID: 888241
- DOI: 10.1016/s0304-3991(76)91385-1
Motif detection in quantum noise-limited electron micrographs by cross-correlation
Abstract
The use of cross-correlation to detect randomly positioned low-dose realizations of a motif in an image field is quantitatively evaluated. For both the bright- and dark-field cases, we derive theoretical expressions for the minimum dose allowing detection in terms of motif size, resolution, and contrast. Model computations on simulated low-dose images of a spherical virus particle give results that agree with our theoretical formulas and demonstrate the feasibility of this approach.
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