Imaging Plasmodium falciparum-infected ghost and parasite by atomic force microscopy
- PMID: 9245748
- DOI: 10.1006/jsbi.1997.3886
Imaging Plasmodium falciparum-infected ghost and parasite by atomic force microscopy
Abstract
Atomic force microscopy was used to image the membrane cytoskeleton network of normal and P. falciparum-infected ghosts. The membrane cytoskeleton network was examined in air-dried ghost preparations from normal and infected cells. We found that the spectrin network was changed in infected ghosts. The thickness of the normal red cell membrane was about 15.05 +/- 2.27 nm, while the thickness of the P. falciparum-infected membrane was found to be 22.97 +/- 3.84 nm. The ghost containing ring stage parasites exhibited areas of particle-like protrusions ranging in size from 0.2 to 0.7 micron. The surface of the P. falciparum parasite was also imaged in air-dried samples, showing the existence of a large protrusion extending from the parasite surface.
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